XRD & XRR — Structural and Thin-Film Metrology

X-Ray Diffraction (XRD) is a non-destructive technique used to determine crystal structure, phase composition, and lattice properties by analyzing how X-rays diffract from a material’s atomic planes. X-Ray Reflectivity (XRR) measures the intensity of X-rays reflected at low angles to precisely determine thin-film thickness, density, and interface roughness.

At JP Analytical, XRD and XRR are combined to provide a complete view of material structure and thin-film quality. Together, these complementary techniques connect crystallography with dimensional metrology — supporting advanced semiconductor and thin-film development where interface control and structural integrity drive performance and yield.