Raman Spectroscopy

JP Analytical offers Raman Spectroscopy as part of our advanced metrology services, providing non-destructive insight into material composition, crystal quality, and strain or defect-related changes. By analyzing the vibrational “fingerprints” of materials through laser-based spectroscopy, Raman enables rapid identification of phases, bonding structure, and process-induced variations.

Our Raman capability supports semiconductor and thin-film research by complementing techniques such as XRD, XPS, and ion beam analysis — helping clients correlate structural, chemical, and optical properties to improve material performance and process control.